Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET

Hong Luo, Huazhong Yang, Rong Luo. Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET. In IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006. pages 956-959, IEEE, 2006. [doi]

Abstract

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