Hong Luo, Huazhong Yang, Rong Luo. Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET. In IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006. pages 956-959, IEEE, 2006. [doi]
@inproceedings{LuoYR06,
title = {Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET},
author = {Hong Luo and Huazhong Yang and Rong Luo},
year = {2006},
doi = {10.1109/APCCAS.2006.342220},
url = {http://dx.doi.org/10.1109/APCCAS.2006.342220},
researchr = {https://researchr.org/publication/LuoYR06},
cites = {0},
citedby = {0},
pages = {956-959},
booktitle = {IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006},
publisher = {IEEE},
}