Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory

Lucas Matana Luza, Alexandre Besser, Viyas Gupta, Arto Javanainen, Ali Mohammadzadeh, Luigi Dilillo. Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]

@inproceedings{LuzaBGJMD19,
  title = {Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory},
  author = {Lucas Matana Luza and Alexandre Besser and Viyas Gupta and Arto Javanainen and Ali Mohammadzadeh and Luigi Dilillo},
  year = {2019},
  doi = {10.1109/DFT.2019.8875475},
  url = {https://doi.org/10.1109/DFT.2019.8875475},
  researchr = {https://researchr.org/publication/LuzaBGJMD19},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-2260-1},
}