Lucas Matana Luza, Alexandre Besser, Viyas Gupta, Arto Javanainen, Ali Mohammadzadeh, Luigi Dilillo. Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.