A Complete Design-for-Test Scheme for Reconfigurable Scan Networks

Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich. A Complete Design-for-Test Scheme for Reconfigurable Scan Networks. J. Electronic Testing, 38(6):603-621, December 2022. [doi]

Authors

Natalia Lylina

This author has not been identified. Look up 'Natalia Lylina' in Google

Chih-Hao Wang

This author has not been identified. Look up 'Chih-Hao Wang' in Google

Hans-Joachim Wunderlich

This author has not been identified. Look up 'Hans-Joachim Wunderlich' in Google