Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich. A Complete Design-for-Test Scheme for Reconfigurable Scan Networks. J. Electronic Testing, 38(6):603-621, December 2022. [doi]
@article{LylinaWW22-2,
title = {A Complete Design-for-Test Scheme for Reconfigurable Scan Networks},
author = {Natalia Lylina and Chih-Hao Wang and Hans-Joachim Wunderlich},
year = {2022},
month = {December},
doi = {10.1007/s10836-022-06038-3},
url = {https://doi.org/10.1007/s10836-022-06038-3},
researchr = {https://researchr.org/publication/LylinaWW22-2},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {38},
number = {6},
pages = {603-621},
}