A Soft Error Resilient Low Leakage SRAM Cell Design

Adithyalal P. M, Shankar Balachandran, Virendra Singh. A Soft Error Resilient Low Leakage SRAM Cell Design. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 133-138, IEEE, 2015. [doi]

Authors

Adithyalal P. M

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Shankar Balachandran

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Virendra Singh

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