Adithyalal P. M, Shankar Balachandran, Virendra Singh. A Soft Error Resilient Low Leakage SRAM Cell Design. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 133-138, IEEE, 2015. [doi]
@inproceedings{MBS15,
title = {A Soft Error Resilient Low Leakage SRAM Cell Design},
author = {Adithyalal P. M and Shankar Balachandran and Virendra Singh},
year = {2015},
doi = {10.1109/ATS.2015.30},
url = {http://dx.doi.org/10.1109/ATS.2015.30},
researchr = {https://researchr.org/publication/MBS15},
cites = {0},
citedby = {0},
pages = {133-138},
booktitle = {24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015},
publisher = {IEEE},
isbn = {978-1-4673-9739-1},
}