Awang Ma, Bin Gao 0006, Xing Mou, Peng Yao, Yiwei Du, Jianshi Tang, He Qian, Huaqiang Wu. Thermal Induced Retention Degradation of RRAM-based Neuromorphic Computing Chips. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{MaGMYDTQW23,
title = {Thermal Induced Retention Degradation of RRAM-based Neuromorphic Computing Chips},
author = {Awang Ma and Bin Gao 0006 and Xing Mou and Peng Yao and Yiwei Du and Jianshi Tang and He Qian and Huaqiang Wu},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118164},
url = {https://doi.org/10.1109/IRPS48203.2023.10118164},
researchr = {https://researchr.org/publication/MaGMYDTQW23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}