Awang Ma, Bin Gao 0006, Xing Mou, Peng Yao, Yiwei Du, Jianshi Tang, He Qian, Huaqiang Wu. Thermal Induced Retention Degradation of RRAM-based Neuromorphic Computing Chips. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.