Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process - researchr publication authors

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Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu. Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectronics Reliability, 52(8):1640-1644, 2012. [doi]

This author has not been identified. Look up 'Fei Ma' in GoogleThis author has not been identified. Look up 'Yan Han' in GoogleThis author has not been identified. Look up 'Shurong Dong' in GoogleThis author has not been identified. Look up 'Meng Miao' in GoogleThis author has not been identified. Look up 'Jianfeng Zheng' in GoogleThis author has not been identified. Look up 'Jian Wu' in GoogleThis author has not been identified. Look up 'Cheng-gong Han' in GoogleThis author has not been identified. Look up 'Kehan Zhu' in Google

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