Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu. Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectronics Reliability, 52(8):1640-1644, 2012. [doi]
@article{MaHDMZWHZ12,
title = {Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process},
author = {Fei Ma and Yan Han and Shurong Dong and Meng Miao and Jianfeng Zheng and Jian Wu and Cheng-gong Han and Kehan Zhu},
year = {2012},
doi = {10.1016/j.microrel.2011.11.011},
url = {http://dx.doi.org/10.1016/j.microrel.2011.11.011},
researchr = {https://researchr.org/publication/MaHDMZWHZ12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {8},
pages = {1640-1644},
}