Fei Ma, Yan Han, Shurong Dong, Meng Miao, Jianfeng Zheng, Jian Wu, Cheng-gong Han, Kehan Zhu. Investigation of ESD protection strategy in high voltage Bipolar-CMOS-DMOS process. Microelectronics Reliability, 52(8):1640-1644, 2012. [doi]
Abstract is missing.