A Novel Approach to the Analysis of VLSI Device Test Programs - researchr publication authors

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Yuhai Ma, Wanchun Shi. A Novel Approach to the Analysis of VLSI Device Test Programs. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 471-480, IEEE Computer Society, 1996.

This author has not been identified. Look up 'Yuhai Ma' in GoogleThis author has not been identified. Look up 'Wanchun Shi' in Google

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