Yuhai Ma, Wanchun Shi. A Novel Approach to the Analysis of VLSI Device Test Programs. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 471-480, IEEE Computer Society, 1996.
@inproceedings{MaS96:0,
title = {A Novel Approach to the Analysis of VLSI Device Test Programs},
author = {Yuhai Ma and Wanchun Shi},
year = {1996},
tags = {program analysis, testing, analysis, systematic-approach},
researchr = {https://researchr.org/publication/MaS96%3A0},
cites = {0},
citedby = {0},
pages = {471-480},
booktitle = {Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996},
publisher = {IEEE Computer Society},
isbn = {0-7803-3541-4},
}