Ruixiang Ma, Fei Wu 0005, Zhonghai Lu, Wenmin Zhong, Qiulin Wu, Jiguang Wan, Changsheng Xie. BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure Prediction. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):4563-4574, 2020. [doi]
@article{MaWLZWWX20,
title = {BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure Prediction},
author = {Ruixiang Ma and Fei Wu 0005 and Zhonghai Lu and Wenmin Zhong and Qiulin Wu and Jiguang Wan and Changsheng Xie},
year = {2020},
doi = {10.1109/TCAD.2020.2981025},
url = {https://doi.org/10.1109/TCAD.2020.2981025},
researchr = {https://researchr.org/publication/MaWLZWWX20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {12},
pages = {4563-4574},
}