Ruixiang Ma, Fei Wu 0005, Zhonghai Lu, Wenmin Zhong, Qiulin Wu, Jiguang Wan, Changsheng Xie. BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure Prediction. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(12):4563-4574, 2020. [doi]
Abstract is missing.