Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy

Xinyang Ma, Rui Xiong, Wei Wang, Xiangchao Zhang. Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy. Sensors, 23(23):9526, December 2023. [doi]

@article{MaXWZ23-0,
  title = {Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy},
  author = {Xinyang Ma and Rui Xiong and Wei Wang and Xiangchao Zhang},
  year = {2023},
  month = {December},
  doi = {10.3390/s23239526},
  url = {https://doi.org/10.3390/s23239526},
  researchr = {https://researchr.org/publication/MaXWZ23-0},
  cites = {0},
  citedby = {0},
  journal = {Sensors},
  volume = {23},
  number = {23},
  pages = {9526},
}