Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy

Xinyang Ma, Rui Xiong, Wei Wang, Xiangchao Zhang. Flexible Measurement of High-Slope Micro-Nano Structures with Tilted Wave Digital Holographic Microscopy. Sensors, 23(23):9526, December 2023. [doi]

Abstract

Abstract is missing.