Delay testing of SOI circuits: Challenges with the history effect - researchr publication

researchr

You are not signed in
Sign in
Sign up

Eric MacDonald, Nur A. Touba. Delay testing of SOI circuits: Challenges with the history effect. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 269-275, IEEE Computer Society, 1999.

Abstract is missing.

runs on WebDSL