Modeling stuck-open faults in CMOS iterative circuits

Enrico Macii, Qing Xu. Modeling stuck-open faults in CMOS iterative circuits. In Third Great Lakes Symposium on Design Automation of High Performance VLSI Systems, Kalamazoo, MI, USA, March 5-6, 1993. pages 14-17, IEEE, 1993. [doi]

Abstract

Abstract is missing.