, An Efficient Test Vector Generation and Reduction Method for an LSI Digital Filter Circuit Using an Adaptive Search Technique - researchr publication authors

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Roderick H. Macmillan, M. R. Bentley. , An Efficient Test Vector Generation and Reduction Method for an LSI Digital Filter Circuit Using an Adaptive Search Technique. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 601-607, IEEE Computer Society, 1982.

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