Roderick H. Macmillan, M. R. Bentley. , An Efficient Test Vector Generation and Reduction Method for an LSI Digital Filter Circuit Using an Adaptive Search Technique. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 601-607, IEEE Computer Society, 1982.
@inproceedings{MacmillanB82,
title = {, An Efficient Test Vector Generation and Reduction Method for an LSI Digital Filter Circuit Using an Adaptive Search Technique},
author = {Roderick H. Macmillan and M. R. Bentley},
year = {1982},
tags = {testing, search},
researchr = {https://researchr.org/publication/MacmillanB82},
cites = {0},
citedby = {0},
pages = {601-607},
booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982},
publisher = {IEEE Computer Society},
}