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An improved compact model of the electrical behaviour of the 5-contact vertical hall-effect device

Morgan Madec, Jean-Baptiste Schell, Jean-Baptiste Kammerer, Christophe Lallement, Luc Hebrard. An improved compact model of the electrical behaviour of the 5-contact vertical hall-effect device. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]

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Morgan Madec

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Jean-Baptiste Schell

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Jean-Baptiste Kammerer

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Christophe Lallement

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Luc Hebrard

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