Morgan Madec, Jean-Baptiste Schell, Jean-Baptiste Kammerer, Christophe Lallement, Luc Hebrard. An improved compact model of the electrical behaviour of the 5-contact vertical hall-effect device. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{MadecSKLH13,
title = {An improved compact model of the electrical behaviour of the 5-contact vertical hall-effect device},
author = {Morgan Madec and Jean-Baptiste Schell and Jean-Baptiste Kammerer and Christophe Lallement and Luc Hebrard},
year = {2013},
doi = {10.1109/NEWCAS.2013.6573659},
url = {http://dx.doi.org/10.1109/NEWCAS.2013.6573659},
researchr = {https://researchr.org/publication/MadecSKLH13},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013},
publisher = {IEEE},
isbn = {978-1-4799-0618-5},
}