Morgan Madec, Jean-Baptiste Schell, Jean-Baptiste Kammerer, Christophe Lallement, Luc Hebrard. An improved compact model of the electrical behaviour of the 5-contact vertical hall-effect device. In IEEE 11th International New Circuits and Systems Conference, NEWCAS 2013, Paris, France, June 16-19, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.