Robert Madge, Brady Benware, W. Robert Daasch. Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Design & Test of Computers, 20(5):46-53, 2003. [doi]
@article{MadgeBD03,
title = {Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs},
author = {Robert Madge and Brady Benware and W. Robert Daasch},
year = {2003},
url = {http://csdl.computer.org/comp/mags/dt/2003/05/d5046abs.htm},
tags = {coverage},
researchr = {https://researchr.org/publication/MadgeBD03},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {20},
number = {5},
pages = {46-53},
}