Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology - researchr publication authors

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Meghna Madhusudan, Jitesh Poojary, Arvind K. Sharma, Ramprasath S, Kishor Kunal, Sachin S. Sapatnekar, Ramesh Harjani. Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology. In 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023. pages 69-72, IEEE, 2023. [doi]

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