Meghna Madhusudan, Jitesh Poojary, Arvind K. Sharma, Ramprasath S, Kishor Kunal, Sachin S. Sapatnekar, Ramesh Harjani. Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology. In 53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023. pages 69-72, IEEE, 2023. [doi]
@inproceedings{MadhusudanPSSKSH23,
title = {Understanding Distance-Dependent Variations for Analog Circuits in a FinFET Technology},
author = {Meghna Madhusudan and Jitesh Poojary and Arvind K. Sharma and Ramprasath S and Kishor Kunal and Sachin S. Sapatnekar and Ramesh Harjani},
year = {2023},
doi = {10.1109/ESSDERC59256.2023.10268572},
url = {https://doi.org/10.1109/ESSDERC59256.2023.10268572},
researchr = {https://researchr.org/publication/MadhusudanPSSKSH23},
cites = {0},
citedby = {0},
pages = {69-72},
booktitle = {53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0423-7},
}