Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test - researchr publication authors

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Yoichi Maeda, Jun Matsushima, Ron Press. Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 237-241, IEEE Computer Society, 2017. [doi]

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