Yoichi Maeda, Jun Matsushima, Ron Press. Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. In 26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017. pages 237-241, IEEE Computer Society, 2017. [doi]
@inproceedings{MaedaMP17,
title = {Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test},
author = {Yoichi Maeda and Jun Matsushima and Ron Press},
year = {2017},
doi = {10.1109/ATS.2017.52},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2017.52},
researchr = {https://researchr.org/publication/MaedaMP17},
cites = {0},
citedby = {0},
pages = {237-241},
booktitle = {26th IEEE Asian Test Symposium, ATS 2017, Taipei City, Taiwan, November 27-30, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-2437-1},
}