Roel Maes, Vladimir Rozic, Ingrid Verbauwhede, Patrick Koeberl, Erik van der Sluis, Vincent van der Leest. Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS. In Proceedings of the 38th European Solid-State Circuit conference, ESSCIRC 2012, Bordeaux, France, September 17-21, 2012. pages 486-489, IEEE, 2012. [doi]
@inproceedings{MaesRVKSL12,
title = {Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS},
author = {Roel Maes and Vladimir Rozic and Ingrid Verbauwhede and Patrick Koeberl and Erik van der Sluis and Vincent van der Leest},
year = {2012},
doi = {10.1109/ESSCIRC.2012.6341361},
url = {http://dx.doi.org/10.1109/ESSCIRC.2012.6341361},
researchr = {https://researchr.org/publication/MaesRVKSL12},
cites = {0},
citedby = {0},
pages = {486-489},
booktitle = {Proceedings of the 38th European Solid-State Circuit conference, ESSCIRC 2012, Bordeaux, France, September 17-21, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2212-6},
}