Jeroen De Maeyer, Pieter Rombouts, Ludo Weyten. Nyquist-criterion based design of a CT ΣΔ-ADC with a reduced number of comparators. In 13th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2006, Nice, France, December 10-13, 2006. pages 411-414, IEEE, 2006. [doi]
Abstract is missing.