Influence of novel MOS varactors on the performance of a fully integrated UMTS VCO in standard 0.25-/spl mu/m CMOS technology

Judith Maget, Marc Tiebout, Rainer Kraus. Influence of novel MOS varactors on the performance of a fully integrated UMTS VCO in standard 0.25-/spl mu/m CMOS technology. J. Solid-State Circuits, 37(7):953-958, 2002. [doi]

Abstract

Abstract is missing.