Mechanical stress measurement electronics based on piezo-resistive and piezo-Hall effects

R. Magnani, Francesco Tinfena, V. Kempe, Luca Fanucci. Mechanical stress measurement electronics based on piezo-resistive and piezo-Hall effects. In Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002. pages 363-366, IEEE, 2002. [doi]

Authors

R. Magnani

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Francesco Tinfena

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V. Kempe

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Luca Fanucci

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