Mechanical stress measurement electronics based on piezo-resistive and piezo-Hall effects

R. Magnani, Francesco Tinfena, V. Kempe, Luca Fanucci. Mechanical stress measurement electronics based on piezo-resistive and piezo-Hall effects. In Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002. pages 363-366, IEEE, 2002. [doi]

@inproceedings{MagnaniTKF02,
  title = {Mechanical stress measurement electronics based on piezo-resistive and piezo-Hall effects},
  author = {R. Magnani and Francesco Tinfena and V. Kempe and Luca Fanucci},
  year = {2002},
  doi = {10.1109/ICECS.2002.1045409},
  url = {https://doi.org/10.1109/ICECS.2002.1045409},
  researchr = {https://researchr.org/publication/MagnaniTKF02},
  cites = {0},
  citedby = {0},
  pages = {363-366},
  booktitle = {Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002},
  publisher = {IEEE},
  isbn = {0-7803-7596-3},
}