Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits

Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer. Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits. In International Symposium on Circuits and Systems (ISCAS 2010), May 30 - June 2, 2010, Paris, France. pages 1699-1702, IEEE, 2010. [doi]

Abstract

Abstract is missing.