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Intelligent image correlation using genetic algorithms for measuring surface deformations in the autonomous inspection of structures

Ajay Mahajan, Alan Pilch, Tsuchin Chu. Intelligent image correlation using genetic algorithms for measuring surface deformations in the autonomous inspection of structures. In American Control Conference, ACC 2000, Chicago, Illinois, USA, 28-30 June, 2000. pages 460-461, IEEE, 2000. [doi]

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