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New triggering-speed-characterization method for diode-triggered SCR using TLP

Mouna Mahane, David Trémouilles, Marise Bafleur, Benjamin Thon, Marianne Diatta, Lionel Jaouen. New triggering-speed-characterization method for diode-triggered SCR using TLP. Microelectronics Reliability, 76:692-697, 2017. [doi]

Authors

Mouna Mahane

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David Trémouilles

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Marise Bafleur

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Benjamin Thon

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Marianne Diatta

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Lionel Jaouen

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