Mouna Mahane, David Trémouilles, Marise Bafleur, Benjamin Thon, Marianne Diatta, Lionel Jaouen. New triggering-speed-characterization method for diode-triggered SCR using TLP. Microelectronics Reliability, 76:692-697, 2017. [doi]
@article{MahaneTBTDJ17,
title = {New triggering-speed-characterization method for diode-triggered SCR using TLP},
author = {Mouna Mahane and David Trémouilles and Marise Bafleur and Benjamin Thon and Marianne Diatta and Lionel Jaouen},
year = {2017},
doi = {10.1016/j.microrel.2017.07.063},
url = {https://doi.org/10.1016/j.microrel.2017.07.063},
researchr = {https://researchr.org/publication/MahaneTBTDJ17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {692-697},
}