S. Mahapatra, S. Shukuri, Jeff Bude. Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 223-226, IEEE Computer Society, 2003. [doi]
@inproceedings{MahapatraSB03, title = {Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs}, author = {S. Mahapatra and S. Shukuri and Jeff Bude}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/vlsid/2003/1868/00/18680223abs.htm}, researchr = {https://researchr.org/publication/MahapatraSB03}, cites = {0}, citedby = {0}, pages = {223-226}, booktitle = {16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-1868-0}, }