External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment

Swaraj Mahato, Georges G. E. Gielen. Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment. In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 413-416, IEEE, 2013. [doi]

Authors

Swaraj Mahato

This author has not been identified. Look up 'Swaraj Mahato' in Google

Georges G. E. Gielen

This author has not been identified. Look up 'Georges G. E. Gielen' in Google
runs on