Swaraj Mahato, Georges G. E. Gielen. Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment. In 20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013. pages 413-416, IEEE, 2013. [doi]
@inproceedings{MahatoG13, title = {Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment}, author = {Swaraj Mahato and Georges G. E. Gielen}, year = {2013}, doi = {10.1109/ICECS.2013.6815442}, url = {http://dx.doi.org/10.1109/ICECS.2013.6815442}, researchr = {https://researchr.org/publication/MahatoG13}, cites = {0}, citedby = {0}, pages = {413-416}, booktitle = {20th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2013, Abu Dhabi, December 8-11, 2013}, publisher = {IEEE}, }