Swaraj Mahato, J. De Ridder, Guy Meynants, Gert Raskin, Hans Van Winckel. A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor. In 15th IEEE International New Circuits and Systems Conference, NEWCAS 2017, Strasbourg, France, June 25-28, 2017. pages 361-364, IEEE, 2017. [doi]
@inproceedings{MahatoRMRW17,
title = {A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor},
author = {Swaraj Mahato and J. De Ridder and Guy Meynants and Gert Raskin and Hans Van Winckel},
year = {2017},
doi = {10.1109/NEWCAS.2017.8010180},
url = {https://doi.org/10.1109/NEWCAS.2017.8010180},
researchr = {https://researchr.org/publication/MahatoRMRW17},
cites = {0},
citedby = {0},
pages = {361-364},
booktitle = {15th IEEE International New Circuits and Systems Conference, NEWCAS 2017, Strasbourg, France, June 25-28, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4991-2},
}