Swaraj Mahato, J. De Ridder, Guy Meynants, Gert Raskin, Hans Van Winckel. A novel technique to characterize the spatial intra-pixel sensitivity variations in a CMOS image sensor. In 15th IEEE International New Circuits and Systems Conference, NEWCAS 2017, Strasbourg, France, June 25-28, 2017. pages 361-364, IEEE, 2017.
Abstract is missing.