Islam A. K. M. Mahfuzul, Hidetoshi Onodera. On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 350-354, IEEE Computer Society, 2012. [doi]
Abstract is missing.