Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera. Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2014, KaoHsiung, Taiwan, November 10-12, 2014. pages 45-48, IEEE, 2014. [doi]
@inproceedings{MahfuzulSIO14,
title = {Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring},
author = {Islam A. K. M. Mahfuzul and Jun Shiomi and Tohru Ishihara and Hidetoshi Onodera},
year = {2014},
doi = {10.1109/ASSCC.2014.7008856},
url = {http://dx.doi.org/10.1109/ASSCC.2014.7008856},
researchr = {https://researchr.org/publication/MahfuzulSIO14},
cites = {0},
citedby = {0},
pages = {45-48},
booktitle = {IEEE Asian Solid-State Circuits Conference, A-SSCC 2014, KaoHsiung, Taiwan, November 10-12, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4090-5},
}