Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring

Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera. Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring. In IEEE Asian Solid-State Circuits Conference, A-SSCC 2014, KaoHsiung, Taiwan, November 10-12, 2014. pages 45-48, IEEE, 2014. [doi]

Abstract

Abstract is missing.