CURRENT: a test generation system for I/sub DDQ/ testing

Udo Mahlstedt, Jürgen Alt, Matthias Heinitz. CURRENT: a test generation system for I/sub DDQ/ testing. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 317-323, IEEE Computer Society, 1995. [doi]

Authors

Udo Mahlstedt

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Jürgen Alt

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Matthias Heinitz

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