Udo Mahlstedt, Jürgen Alt, Matthias Heinitz. CURRENT: a test generation system for I/sub DDQ/ testing. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 317-323, IEEE Computer Society, 1995. [doi]
@inproceedings{MahlstedtAH95,
title = {CURRENT: a test generation system for I/sub DDQ/ testing},
author = {Udo Mahlstedt and Jürgen Alt and Matthias Heinitz},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000317abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/MahlstedtAH95},
cites = {0},
citedby = {0},
pages = {317-323},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}